Luminescence dosimetry with ceramic materials for application to radiological emergencies and other incidents
The likelihood of the occurrence of radiological accidents which can induce significant health consequences to the members of the public has raised the importance of developing a personal radiation dosimetry system applicable to populations not monitored by dedicated dosemeters. Mobile phones are personal devices with high ubiquity and great potential for accident dosimetry applications. Alumina surface mount resistors (SMRs) are abundant in the printed circuit board of mobile phones and their potential as fortuitous dosemeters has been investigated using thermoluminescence (TL) and optically stimulated luminescence (OSL) techniques. The physical mechanism of the generation of luminescence of the alumina SMRs is, however, less known. The basic luminescence defects in SMRs were identified to be F-type centres and their emission process was shown to be temperature dependent and highly quenched at room temperature (RT). The trap environment of beta irradiated SMRs includes a series of closely spaced traps covering thermal depths between 0.9-1.4 eV; predicting an average lifetime for thermal fading at RT of ca 23 years. Trapped charges evicted by thermal or optical stimulation are likely to recombine at F-type
Kouroukla, Eftychia
Luminescence dosimetry with ceramic materials for application to radiological emergencies and other incidents. The likelihood of the occurrence of radiological accidents which can induce significant health consequences to the members of the public has raised the importance of developing a personal radiation dosimetry system applicable to populations not monitored by dedicated dosemeters. Mobile phones are personal devices with high ubiquity and great potential for accident dosimetry applications. Alumina surface mount resistors (SMRs) are abundant in the printed circuit board of mobile phones and their potential as fortuitous dosemeters has been investigated using thermoluminescence (TL) and optically stimulated luminescence (OSL) techniques. The physical mechanism of the generation of luminescence of the alumina SMRs is, however, less known. The basic luminescence defects in SMRs were identified to be F-type centres and their emission process was shown to be temperature dependent and highly quenched at room temperature (RT). The trap environment of beta irradiated SMRs includes a series of closely spaced traps covering thermal depths between 0.9-1.4 eV; predicting an average lifetime for thermal fading at RT of ca 23 years. Trapped charges evicted by thermal or optical stimulation are likely to recombine at F-type
luminescence ceramic_material application emergency incident likelihood occurrence accident induce significant health consequence member public raise importance develop personal radiation system applicable population monitor dedicated mobile phone personal device high ubiquity great_potential accident application surface mount abundant print circuit board mobile phone potential investigate use thermoluminescence optically_stimulate luminescence technique physical mechanism generation luminescence however less_know basic luminescence defect identify type centre emission process show temperature dependent highly room temperature trap environment include series closely trap cover thermal depth predict average lifetime thermal charge thermal optical stimulation likely type